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Recent progress on infrared polarization effect and polarization remote applications

  • role： First author第一作者
  • Affiliation：

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

    Department of Electronic Engineering, School of Information Science and Technology, East China Normal University, Shanghai 200241, China

  • Email：jhchu@mail.sitp.ac.cn
  • Introduction：褚君浩，1945年生，男，研究员，中国科学院院士，研究方向为红外光谱学及红外光电子学。E-mail：jhchu@mail.sitp.ac.cn
Junhao CHU12,  
  • role： Corresponding author通信作者
  • Affiliation：

    Department of Electronic Engineering, School of Information Science and Technology, East China Normal University, Shanghai 200241, China

  • Email：zghu@ee.ecnu.edu.cn
  • Introduction：胡志高，1975年生，男，教授，研究方向为凝聚态光谱及光电子学。E-mail：zghu@ee.ecnu.edu.cn
Zhigao HU2*

Resümee

This study described the infrared polarization effect, which is one of the polarization effects of high-resolution quantitative remote sensing instruments. The mechanism and new progress in instrument detection are summarized. Light polarization information is missing in the current rapid development of optoelectronics and optical studies. The polarization characteristics, which can be extracted using additional information based on the detected object and the object of study, extend the detection dimension and improve the sensitivity. Furthermore, the measurement technology of infrared polarization effect and some advances in infrared remote sensing mainly from the aspects of basic and applied research are summarized. Then, potential applications from different viewpoints to observe the polarization effect are discussed. In this context, the infrared spectroscopic ellipsometry and its applications in detecting the optical properties of inorganic and organic thin film systems are introduced. Finally, the theory and related progress of infrared polarization optical instruments are summarized, especially their potential applications in space remote sensing.

Schlüsselwort

infrared;polarization;ellipsometric spectra;remoting sensing

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